Atomic Force Microscopy (AFM) Systems for Nanoscale Precision
MICROSCOPY AND IMAGING delivers high-resolution AFM systems for surface imaging, nanomechanical analysis, and material property mapping across industries.
Non-Destructive 3D Imaging with AFM Technology
Atomic Force Microscopy (AFM) is a nanoscale imaging technique used to map the topography, mechanical properties, and molecular interactions of a sample surface with atomic resolution. AFM operates by scanning a sharp probe across the surface of a specimen, measuring forces between the tip and the sample to create detailed 3D surface profiles in air, liquid, or vacuum environments. It is widely adopted in materials science, life sciences, nanotechnology, and semiconductor industries.
Across North America, research institutions and industrial labs rely on AFM for accurate and non-destructive surface characterization. MICROSCOPY AND IMAGING supports this demand by providing robust, user-friendly AFM systems tailored for both research and production environments. As a B2B company committed to reliability and innovation, we help organizations enhance their imaging and analytical capabilities through expert integration, personalized support, and continuous product evolution.
Core Components of AFM Systems
In addition to offering products and systems developed by our team and trusted partners for Atomic Force Microscopy (AFM), we are proud to carry top-tier technologies from Global Advanced Operations Tek Inc. (GAO Tek Inc.) and Global Advanced Operations RFID Inc. (GAO RFID Inc.). These reliable, high-quality products and systems enhance our ability to deliver comprehensive technologies, integrations, and services you can trust. Where relevant, we have provided direct links to select products and systems from GAO Tek Inc. and GAO RFID Inc.
Hardware
- Precision microcantilevers with piezoresistive or optical sensorsOptical & Imaging Sensors (IoT Sensors) – enable ultra-sensitive detection of surface forces and nanoscale deflections.
- XYZ nano positioning stages with closed-loop feedback
Motion & Position Sensors(IoT Sensors) – ensure atomic-scale accuracy in tip-sample manipulation and surface mapping. - Vibration isolation platforms and acoustic enclosures
Vibration Meters(Structural Testers) – monitor and maintain environmental stability critical for high-resolution AFM imaging. - High-bandwidth photodetectors for laser deflection measurement
Mixed Oscilloscope(Electrical Testers) – used to analyse and visualize fast signal responses from AFM photodetectors. - Advanced AFM control units with real-time scan processing
Device Edge(Edge Computing) – supports high-speed data acquisition, tip control, and image reconstruction.
Software
- Real-time topography and force imaging
- Advanced nanomechanical mapping (e.g., modulus, adhesion, stiffness)
- Phase imaging, magnetic/electrostatic force mapping, and Kelvin probe force microscopy
- Automated probe calibration and data correction tools
- 3D rendering, annotation, and export in publication-ready formats
Cloud Services
- Secure remote access to acquired data and control interface
- Centralized project management and sample tracking
- Long-term archival of high-resolution AFM datasets
- Collaboration tools for multi-site teams and joint R&D efforts
Key Features and Functionalities
- Resolution down to sub-nanometer scale
- Operates in air, liquid, or controlled atmospheres
- Wide range of operational modes (contact, tapping, non-contact, conductive)
- Capable of measuring nanoscale mechanical, electrical, and magnetic properties
- Automated scanning and programmable workflows
- Minimal sample preparation and non-destructive testing
Integrations
- Raman spectroscopy and IR modules for correlative imaging
- SEM and optical microscopy systems for hybrid analysis
- Laboratory automation systems and cleanroom protocols
- AI-based surface classification and pattern recognition tools
- Cloud-connected data management and LIMS platforms
Compatibility
- Supports probes and cantilevers from multiple manufacturers
- Compatible with cleanroom and glovebox environments
- Interoperable with major imaging and analysis software (e.g., Gwyddion, SPIP)
- Data formats suitable for cross-platform research and publication
- Modular upgrades for hybrid microscopy (AFM-Raman, AFM-SEM)
Benefits
- No need for vacuum or electron beams, preserving sample integrity
- Ideal for fragile, soft, or live biological samples
- Enables property mapping across mechanical, chemical, and electrical domains
- Supported by MICROSCOPY AND IMAGING’s expert integration, service, and customization options
- Direct, high-resolution imaging of nanoscale features
Applications
- Surface topography and roughness characterization
- Nanomechanical testing of polymers, composites, and biomaterials
- Protein and DNA analysis in bioscience research
- Semiconductor and MEMS inspection
- Tribological studies and material adhesion testing
- Quality control in thin film and coating industries
Industries
- Nanotechnology & Materials Science
- Biomedical & Life Sciences
- Semiconductor & Microelectronics
- Energy Storage & Coatings
- Research Universities & National Laboratories
- Surface Chemistry & Advanced Manufacturing
Relevant Industry Standards
ISO 25178
ASTM E2530
FDA CFR 21 Part 11
ANSI/NCSL Z540
Health Canada Medical Device Licensing
Case Studies
Nanomaterials Research Lab, Texas
A university-affiliated lab used MICROSCOPY AND IMAGING’s AFM system for surface analysis of newly developed 2D materials. The high-resolution topography and nanomechanical mapping helped uncover mechanical strength anomalies and directly contributed to three published research papers.
Biomedical Device Manufacturer, Minnesota
A medical device company integrated MICROSCOPY AND IMAGING’s AFM system to validate nanoscale surface textures of implantable polymers. By confirming critical adhesion and roughness parameters, they improved regulatory compliance and reduced batch testing failures by 30%.
Canadian Government Materials Lab, Ottawa
A national research facility used MICROSCOPY AND IMAGING’s AFM-Raman integrated solution to analyze the degradation of protective coatings on aerospace materials. The multi-modal data improved modeling accuracy and informed next-generation coating designs for harsh environments.
Contact Us
Looking to enhance your nanoscale imaging capabilities with AFM?
Contact us today for personalized support, solution recommendations, and full-service integration. Let our experts guide you in choosing the right Atomic Force Microscopy system for your scientific or industrial application.