High-Performance Scanning Electron Microscopy (SEM) Solutions
MICROSCOPY AND IMAGING delivers scalable SEM systems for precise surface imaging, elemental analysis, and microstructure inspection in demanding industries.
High-Resolution Surface Analysis with SEM
Scanning Electron Microscopy (SEM) is a powerful imaging technique that provides detailed, three-dimensional-like images of sample surfaces with nano meter resolution. By scanning a focused beam of electrons across a specimen, SEM detects secondary and backscattered electrons to reveal topography, composition, and morphology. It is widely used for surface characterization in materials science, forensics, manufacturing, and biological studies.
MICROSCOPY AND IMAGING offers advanced SEM systems designed for research labs, production lines, and inspection environments across North America. As a trusted B2B provider, we help businesses integrate scalable SEM platforms with high throughput, stability, and custom configurations. From failure analysis in semiconductor manufacturing to biological sample evaluation, MICROSCOPY AND IMAGING provides reliable, user-friendly solutions backed by a strong support framework. With a focus on innovation, product reliability, and quality assurance, we empower organizations to achieve exceptional imaging performance in a range of applications.
Core Components of SEM Systems
In addition to offering products and systems developed by our team and trusted partners for Scanning Electron Microscopy (SEM), we are proud to carry top-tier technologies from Global Advanced Operations Tek Inc. (GAO Tek Inc.) and Global Advanced Operations RFID Inc. (GAO RFID Inc.). These reliable, high-quality products and systems enhance our ability to deliver comprehensive technologies, integrations, and services you can trust. Where relevant, we have provided direct links to select products and systems from GAO Tek Inc. and GAO RFID Inc
Hardware
- Electron beam generators with high-voltage power supplies
Power Adapters and Converters(Electronics) – deliver regulated high-voltage input required for stable beam generation. - Electromagnetic lens columns and deflection coils
Digital Oscilloscopes(Electrical Testers) – used to monitor and tune the performance of beam shaping and focusing systems. - Specimen stages with motorized XYZ movement
Device Edge(Edge Computing) – supports localized control and data processing for high-precision stage motion. - Secondary and backscattered electron detectors
Optical & Imaging Sensors(IoT Sensors) – detect signal electrons and convert them into high-resolution imaging data. - Vacuum pumps and environmental isolation systems
Other Gas Detectors(Commercial Gas Detectors) – used for leak detection and vacuum integrity assurance during SEM operations.
Software
- Real-time image capture with auto-contrast and brightness
- Measurement tools for dimensions, angles, and surface roughness
- Image stitching for large-area inspection
- Integrated EDS (Energy Dispersive Spectroscopy) software for elemental analysis
- Data annotation, report generation, and archiving tools
Cloud Services
- Secure cloud storage of large imaging datasets
- Remote monitoring and diagnostics
- Multi-user collaboration and access control
- Integration with enterprise data systems and ELNs
Key Features and Functionalities
- Resolution down to 1 nano meter for fine surface detail
- Multiple detection modes: SE, BSE, and X-ray
- Variable pressure and environmental SEM capabilities
- Fast image acquisition and batch scanning
- EDS integration for chemical composition analysis
- Optional in-situ heating or tensile testing for materials under stress
Integrations
MICROSCOPY AND IMAGING’s SEM systems support integration with:
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- EDS and EBSD (Electron Backscatter Diffraction) modules
- Sample preparation tools like sputter coaters and ion mills
- Automated inspection and classification systems
- Data analytics platforms and AI-based defect recognition tools
- Laboratory data management platforms (LIMS) and secure servers
Compatibility
- Compatible with standard specimen holders and third-party stages
- USB, Ethernet, and proprietary connectivity options
- Interoperable with Windows-based and Linux control software
- Export formats compatible with CAD, microscopy, and image analysis software
- Customization options available for academia, industry, or QA/QC labs
Benefits
- High-resolution surface analysis in real-time
- Minimal sample preparation for most solid materials
- Accurate defect detection, contamination analysis, and failure evaluation
- Supports both research and industrial-scale workflows
- Modular configurations and upgrade paths available
- Backed by MICROSCOPY AND IMAGING’s expert support and quality assurance standards
Applications
- Surface topography and morphology analysis
- Defect inspection in semiconductors and microelectronics
- Elemental mapping and particle characterization
- Forensic analysis of trace evidence and materials
- Failure analysis of mechanical components and coatings
- Biological and botanical imaging (e.g., insect structures, pollen grains)
Industries
- Semiconductor & Electronics Manufacturing
- Materials Science & Nanotechnology
- Forensic Science & Law Enforcement
- Automotive & Aerospace Engineering
- Biomedical Research & Diagnostics
- Quality Control & Product Inspection
Relevant Industry Standards
ISO/IEC 17025
ASTM E1508
ANSI/AAMI ST98
FDA 21 CFR Part 11
Health Canada MDL (Medical Device Licensing)
Case Studies
Semiconductor Manufacturer, Arizona
A leading chip fabrication company worked with MICROSCOPY AND IMAGING to integrate a high-resolution SEM system into their QA process. With nanometer-scale defect detection and integrated EDS, the system improved their line yield by 22% and shortened failure analysis time by over 40%.
Automotive Supplier, Michigan
An automotive parts manufacturer partnered with MICROSCOPY AND IMAGING to adopt SEM for quality control of metallic coatings. The system enabled high-speed surface inspection and helped reduce coating defects across production batches, resulting in improved customer satisfaction and lower rework costs.
Canadian Research University, Quebec
A top-tier Canadian university implemented MICROSCOPY AND IMAGING’s field emission SEM system in its nanotechnology lab. The system supported student research and advanced studies in biomaterials, enabling sub-10nm imaging and EDS-supported analysis across multidisciplinary programs.
Want to explore how Scanning Electron Microscopy can advance your operations?
Contact us for tailored guidance, solution design, and technical support. Our team is ready to help you select the right SEM system for your application—whether you are in research, manufacturing, or advanced inspection.