Precision Scanning Tunnelling Microscopy (STM) Systems
Explore reliable, scalable Brightfield Microscopy systems designed to meet the demands of advanced imaging in commercial and research settings.
Atomic-Level Imaging with Scanning Tunnelling Microscopy (STM)
Scanning Tunnelling Microscopy (STM) is a high-resolution technique that enables the visualization and manipulation of conductive surfaces at the atomic level. STM relies on quantum tunnelling: a sharp conductive tip scans the surface at an atomic distance, measuring the tunnelling current to map topography and electronic properties in real time. This method is crucial for applications in nanotechnology, surface science, semiconductor research, and quantum materials development.
Across North America, MICROSCOPY AND IMAGING provides customized STM solutions for research institutions and industrial labs requiring ultra-fine spatial resolution and precise control. As a B2B provider committed to product innovation and customer-focused support, we help clients integrate STM systems into their workflows with expert consultation, advanced hardware, and ongoing technical assistance. With strict quality assurance, continuous product development, and scalable support infrastructure, we deliver STM platforms designed to meet the demanding needs of atomic-scale research and advanced manufacturing.
Core Components of STM Systems
In addition to offering products and systems developed by our team and trusted partners for Scanning Tunnelling Microscopy (STM), we are proud to carry top-tier technologies from Global Advanced Operations Tek Inc. (GAO Tek Inc.) and Global Advanced Operations RFID Inc. (GAO RFID Inc.). These reliable, high-quality products and systems enhance our ability to deliver comprehensive technologies, integrations, and services you can trust. Where relevant, we have provided direct links to select products and systems from GAO Tek Inc. and GAO RFID Inc.
Hardware
- Sharp conductive probe tips with sub-nanometer precision
Proximity & Presence Sensors(IoT Sensors) – enable atomic-scale tunneling current detection for surface imaging. - Piezoelectric scanners with ultra-fine resolution
Ultrasonic & Mass Flow Meters(Structural Testers) – aid in precise control and calibration of piezo-driven scanning movement. - Low-noise current amplifiers and feedback electronics
Digital Oscilloscopes(Electrical Testers) – used for capturing tunneling current variations in real-time with high fidelity. - Vibration isolation and temperature-controlled vacuum enclosures
Temperature & Process Calibrators(Environmental Test Instruments) – support environmental stability for high-resolution STM measurements. - High-precision STM control and visualization units
Industrial Tablet PCs (Electronics)– offer real-time visualization and manipulation of STM imaging parameters at atomic scales.
Software
- Real-time control of scan parameters and tip positioning
- 2D and 3D topographic and electronic density mapping
- Spectroscopic analysis (e.g., STS – Scanning Tunnelling Spectroscopy)
- Tip approach and retraction automation
- Integrated imaging, analytics, and reporting tools
Cloud Services
- Remote monitoring and control of imaging sessions
- Secure storage of atomic-resolution datasets
- Real-time sharing for multi-lab collaboration
- Workflow logging, version tracking, and audit support
Key Features and Functionalities
- Atomic-scale resolution of conductive surfaces
- Sensitive tunnelling current measurements for electronic property mapping
- Operates in UHV, inert gas, or ambient conditions
- Scanning Tunnelling Spectroscopy (STS) for local density of states analysis
- Automated tip approach and feedback loop control
- Temperature-controlled sample environments (optional)
Integrations
MICROSCOPY AND IMAGING’s STM systems support integration with:
- Atomic manipulation and lithography modules
- AFM modules for hybrid STM-AFM platforms
- Cryogenic and variable-temperature sample stages
- Electron beam deposition and FIB tools
- Cloud-based storage and AI-assisted pattern recognition software
Compatibility
- Works with standard conductive samples and metal substrates
- Interfaces with popular STM tip preparation stations
- Compatible with major imaging platforms and export formats
- Modular designs for adding spectroscopy or hybrid imaging modes
API support for custom automation and lab integratio
Benefits
- Enables direct imaging of atoms and surface features
- Provides unmatched spatial resolution for surface science
- Supports nanoscale device prototyping and manipulation
- Low-noise operation with sub-picometer accuracy
- Reliable, robust systems backed by MICROSCOPY AND IMAGING’s expert technical support
- Expandable to include spectroscopy and environmental control
Applications
- Atomic-scale imaging of conductive surfaces
- Local electronic property mapping (band gap, density of states)
- Surface reconstruction and defect analysis
- Quantum dot and molecular electronics studies
- Nanofabrication and atom-by-atom surface manipulation
- Characterization of thin films, catalysts, and superconductors
Industries
- Nanotechnology & Surface Science
- Quantum Computing & Materials Research
- Semiconductor & Microelectronics
- Academic & Government Research Institutions
- Energy & Advanced Materials Development
- Industrial Metrology and R&D
Relevant Industry Standards
ISO/IEC 17025
ASTM E1588
ANSI/NCSL Z540
FDA 21 CFR Part 11
Health Canada MDL (Medical Device Licensing)
Case Studies
Quantum Research Lab, Illinois
A national research facility partnered with us to implement a cryogenic STM system for imaging topological insulators. The sub-angstrom resolution allowed researchers to map electronic wavefunctions and detect quantum phase transitions, contributing to pioneering quantum material discoveries.
Nanotech Manufacturer, California
A nanofabrication startup adopted our STM platform for atomic-level surface preparation and defect identification in carbon-based materials. The system enabled precise feedback control, resulting in reduced material loss and improved throughput in graphene patterning.
University of Physics Department, Ontario
A university physics lab integrated our STM system with a low-temperature UHV chamber to investigate superconducting materials. The atomic-resolution imaging supported the development of new theoretical models and enhanced the institution’s international research collaborations.
Looking to explore atomic-resolution imaging with Scanning Tunnelling Microscopy?
Reach out to us to speak with our specialists. We offer expert guidance, full system integration, and personalized support to help you build a powerful STM workflow tailored to your research or production goals.